{"title":"Combination of STEM multislice simulations and 4D STEM: measuring atomic bonding effects","authors":"Damien Heimes","doi":"10.22443/rms.emc2020.714","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the European Microscopy Congress 2020","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.22443/rms.emc2020.714","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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