Single event effect test results for candidate spacecraft electronics

K. Label, A. Moran, C. Seidleck, E. Stassinopoulos, J. Barth, P. Marshall, M. Carts, C. Marshall, J. Kinnison, B. Carkhuff
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引用次数: 13

Abstract

We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links.
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候选航天器电子设备单事件效应试验结果
给出了候选航天器电子设备重离子和质子单事件效应(SEE)地面试验结果。各种数字,模拟和光纤设备进行了测试,包括dram, fpga和光纤链路。
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