Dielectric spectroscopy in Silicone Rubber Incorporating Nanofillers

N. Andres Perez, A. Sylvestre, J. Augé, M. T. Do, S. Rowe
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引用次数: 6

Abstract

Dielectric isothermal spectroscopy is performed on micro composite and micro/nano composite silicone rubber in the ranges of temperature and frequency of [113-293 K] and [10-1-106 Hz] respectively. Two specimen have been studied: i) a commercial liquid silicone rubber LSR containing `micro-sized' fumed silica fillers; ii) the same silicone rubber in which we added 0.10 weight fraction of nano SiOx particles. A comparison of their dielectric responses (real epsiv' and imaginary epsiv" parts of dielectric permittivity) is presented. For the commercial LSR without nano SiOx, typical values of epsiv' and epsiv" have been obtained. As plotted against the temperature (at a fixed frequency) epsiv' and epsiv" present a maximum around 155 K which is attributed to the a relaxation around the glass transition. A strong relaxation peak is observed as nano particles are added in the commercial silicone rubber. The more probable phenomenon to explain this peak is the adsorption of water at the filler surface before mixing.
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含纳米填料硅橡胶的介电光谱研究
分别在[113-293 K]和[10-1-106 Hz]的温度和频率范围内对微复合硅橡胶和微纳米复合硅橡胶进行介电等温光谱分析。研究了两个样品:i)含有“微尺寸”气相二氧化硅填料的商用液态硅橡胶LSR;ii)同样的硅橡胶,我们在其中添加了0.10重量分数的纳米SiOx颗粒。比较了它们的介电常数响应(介电常数的实极性和虚极性部分)。对于不含纳米SiOx的商用LSR,得到了典型的epsiv'和epsiv"值。随着温度(固定频率下)的变化,epsiv'和epsiv'在155 K左右出现最大值,这归因于玻璃化转变周围的弛豫。在商用硅橡胶中加入纳米颗粒,观察到一个强的弛豫峰。更可能解释这一峰值的现象是混合前填料表面对水的吸附。
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