{"title":"Method to Detect Internal Defects of CMOS-Microcircuits","authors":"I. Bulaev","doi":"10.30894/ISSN2409-0239.2018.5.1.93.99","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":436954,"journal":{"name":"Rocket-Space Device Engineering and Information Systems","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Rocket-Space Device Engineering and Information Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.30894/ISSN2409-0239.2018.5.1.93.99","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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