Identifying semiconductors by D.C. ionization conductivity

S. Derenzo, E. Bourret-Courchesne, F. James, M. Klintenberg, Y. Porter-Chapman, J. Wang, M. Weber
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引用次数: 2

Abstract

We describe a method for identifying semiconductor radiation detector materials based on the mobility of internally generated electrons and holes. It was designed for the early stages of exploration, when samples are not available as single crystals, but as crystalline powders. Samples are confined under pressure in an electric field and semiconductors are identified by an increase in d.c. conductivity during exposure to a high-intensity source of 60Co gamma rays. Using this method, we have determined that BiOI, PbIF, BiPbO2Cl, BiPbO2Br, BiPbO2I, Bi2GdO4Cl, Pb3O2I2, and Pb5O4I2 are semiconductors
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用直流电离电导率鉴定半导体
我们描述了一种基于内部产生的电子和空穴的迁移率来识别半导体辐射探测器材料的方法。它是为勘探的早期阶段设计的,那时样品不是单晶的,而是结晶粉末的。样品被限制在电场的压力下,在暴露于高强度60Co伽马射线源期间,通过增加直流电导率来识别半导体。利用这种方法,我们已经确定了BiOI、PbIF、BiPbO2Cl、BiPbO2Br、BiPbO2I、Bi2GdO4Cl、Pb3O2I2和Pb5O4I2是半导体
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