A New Approach for Testing Properties of Discrete Distributions

Ilias Diakonikolas, D. Kane
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引用次数: 149

Abstract

We study problems in distribution property testing: Given sample access to one or more unknown discrete distributions, we want to determine whether they have some global property or are epsilon-far from having the property in L1 distance (equivalently, total variation distance, or "statistical distance").In this work, we give a novel general approach for distribution testing. We describe two techniques: our first technique gives sample-optimal testers, while our second technique gives matching sample lower bounds. As a consequence, we resolve the sample complexity of a wide variety of testing problems. Our upper bounds are obtained via a modular reduction-based approach. Our approach yields optimal testers for numerous problemsby using a standard L2-identity tester as a black-box. Using this recipe, we obtain simple estimators for a wide range of problems, encompassing many problems previously studied in the TCS literature, namely: (1) identity testing to a fixed distribution, (2) closeness testing between two unknown distributions (with equal/unequal sample sizes), (3) independence testing (in any number of dimensions), (4) closeness testing for collections of distributions, and(5) testing histograms. For all of these problems, our testers are sample-optimal, up to constant factors. With the exception of (1), ours are the first sample-optimal testers for the corresponding problems. Moreover, our estimators are significantly simpler to state and analyze compared to previous results. As an important application of our reduction-based technique, we obtain the first adaptive algorithm for testing equivalence betweentwo unknown distributions. The sample complexity of our algorithm depends on the structure of the unknown distributions - as opposed to merely their domain size -and is significantly better compared to the worst-case optimal L1-tester in many natural instances. Moreover, our technique naturally generalizes to other metrics beyond the L1-distance. As an illustration of its flexibility, we use it to obtain the first near-optimal equivalence testerunder the Hellinger distance. Our lower bounds are obtained via a direct information-theoretic approach: Given a candidate hard instance, our proof proceeds by boundingthe mutual information between appropriate random variables. While this is a classical method in information theory, prior to our work, it had not been used in this context. Previous lower bounds relied either on the birthday paradox, oron moment-matching and were thus restricted to symmetric properties. Our lower bound approach does not suffer from any such restrictions and gives tight sample lower bounds for the aforementioned problems.
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一种检验离散分布性质的新方法
我们研究分布性质测试中的问题:给定一个或多个未知离散分布的样本访问权,我们想确定它们是否具有一些全局性质,或者在L1距离(等效地,总变异距离,或“统计距离”)中是否具有epsilon-far的性质。在这项工作中,我们给出了一种新的通用分布测试方法。我们描述了两种技术:我们的第一种技术给出了样本最优的测试器,而我们的第二种技术给出了匹配的样本下界。因此,我们解决了各种测试问题的样本复杂性。我们的上界是通过基于模约化的方法得到的。我们的方法通过使用标准的l2身份测试器作为黑盒,为许多问题生成最佳测试器。使用这个配方,我们获得了广泛问题的简单估计,包括以前在TCS文献中研究的许多问题,即:(1)对固定分布的同一性检验,(2)两个未知分布之间的紧密性检验(具有相等/不等样本量),(3)独立性检验(在任意数量的维度上),(4)分布集合的紧密性检验,以及(5)直方图检验。对于所有这些问题,我们的测试人员都是样本最优的,直到常数因素。除了(1),我们是第一个针对相应问题的样本最优测试者。此外,与以前的结果相比,我们的估计器的陈述和分析明显更简单。作为我们基于约简技术的一个重要应用,我们获得了第一个用于测试两个未知分布之间等价性的自适应算法。我们算法的样本复杂性取决于未知分布的结构——而不仅仅是它们的域大小——在许多自然实例中,与最坏情况下的最优l1测试器相比,我们的算法明显更好。此外,我们的技术自然地推广到l1距离以外的其他指标。为了说明它的灵活性,我们用它获得了海灵格距离下的第一个近似最优等效测试仪。我们的下界是通过直接的信息论方法得到的:给定一个候选的硬实例,我们的证明通过对适当的随机变量之间的互信息进行定界来进行。虽然这是信息论中的经典方法,但在我们的工作之前,它并没有在这种情况下使用。之前的下界要么依赖于生日悖论,要么依赖于矩匹配,因此仅限于对称性质。我们的下界方法不受任何此类限制,并为上述问题提供了严格的样本下界。
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