A. Anderson, L. D. La Fleur, M. Kasserls, D. Zweig
{"title":"Angstrom-level Calibration of Eight Inch Flats using a Scanning Fizeau Interferometer","authors":"A. Anderson, L. D. La Fleur, M. Kasserls, D. Zweig","doi":"10.1364/oft.1992.thb3","DOIUrl":null,"url":null,"abstract":"A scanning Fizeau interferometer is used to measure a set of eight inch reference flats. The uncertainty in the measured figure is less that 2 Årms.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fabrication and Testing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1992.thb3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A scanning Fizeau interferometer is used to measure a set of eight inch reference flats. The uncertainty in the measured figure is less that 2 Årms.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
