Analysis of multilayer microstrip line of finite conductor thickness using Quasi-Static Spectral Domain Analysis (SDA) and Single Layer Reduction (SLR) method

Abstract

This paper presents a study of Multilayer Microstrip line of finite conductor thickness using Quasi-Static Spectral Domain Analysis (SDA) method. The finite conductor thickness of the strip is replaced by two parallel strips of zero conductor thickness. The Green's function for the multilayer microstrip line in Fourier domain is obtained by Transverse Transmission Line (TTL) technique. Galerkin's method is applied to find the effective dielectric constant and impedance. Dielectric Loss of multilayer microstrip line is calculated by converting multilayer microstrip line structure into single layer microstrip line using Single Layer Reduction (SLR) method. The Conductor Loss of microstrip line is calculated by Wheeler's incremental inductance method. The effect of finite conductor thickness is also analysed on the impedance, effective relative permittivity, dielectric loss and conductor loss.