A study of SU-8 photoresist in deep trenches for silicon-embedded microinductors

E. Laforge, Caroline Rabot, Ningning Wang, Z. Pavlović, P. McCloskey, C. O'Mathúna
{"title":"A study of SU-8 photoresist in deep trenches for silicon-embedded microinductors","authors":"E. Laforge, Caroline Rabot, Ningning Wang, Z. Pavlović, P. McCloskey, C. O'Mathúna","doi":"10.1117/12.2247894","DOIUrl":null,"url":null,"abstract":"Epoxy-based resist SU-8 is widely used in the development and fabrication of high-aspect-ratio (HAR) MEMS structures. It has proven to be a suitable photoresist combining thick layer coating and good adhesion on silicon substrates as well as possessing good mechanical and chemical stability. However, the trend towards minia- turization and increasing packaging density has pushed the demand for challenging micro-machining processes. As an example, a novel design of a MEMS microinductor requires a dielectric permanent layer coated in deep silicon trenches in order to insulate copper windings from the magnetic material deposited in these trenches. This requires the development of a photolithography process which enables the coating of a void-free layer filling the trenches. In this paper, the use of thick SU-8 photoresist for filling deep silicon trenches is investigated. Different SU-8 formulations are analyzed, processed and results are compared. As a result, an optimized process is developed to achieve void-free filled trenches and a uniform planar layer above them, with near vertical sidewall patterns.","PeriodicalId":287066,"journal":{"name":"European Mask and Lithography Conference","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"European Mask and Lithography Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2247894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Epoxy-based resist SU-8 is widely used in the development and fabrication of high-aspect-ratio (HAR) MEMS structures. It has proven to be a suitable photoresist combining thick layer coating and good adhesion on silicon substrates as well as possessing good mechanical and chemical stability. However, the trend towards minia- turization and increasing packaging density has pushed the demand for challenging micro-machining processes. As an example, a novel design of a MEMS microinductor requires a dielectric permanent layer coated in deep silicon trenches in order to insulate copper windings from the magnetic material deposited in these trenches. This requires the development of a photolithography process which enables the coating of a void-free layer filling the trenches. In this paper, the use of thick SU-8 photoresist for filling deep silicon trenches is investigated. Different SU-8 formulations are analyzed, processed and results are compared. As a result, an optimized process is developed to achieve void-free filled trenches and a uniform planar layer above them, with near vertical sidewall patterns.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
深沟槽中SU-8光刻胶的研究
环氧基抗蚀剂SU-8广泛应用于高纵横比(HAR) MEMS结构的开发和制造。它是一种适合的光刻胶,具有较厚的涂层和良好的附着力,并具有良好的机械和化学稳定性。然而,小型化的趋势和包装密度的增加推动了对具有挑战性的微加工工艺的需求。例如,一种新的MEMS微电感器设计需要在深硅沟槽中涂覆一层介电永久层,以便将铜绕组与沉积在这些沟槽中的磁性材料隔离开来。这就要求开发一种光刻工艺,使无空洞层的涂层能够填充沟槽。本文研究了厚SU-8光刻胶在深硅沟槽填充中的应用。对不同的SU-8配方进行了分析、加工,并对结果进行了比较。因此,开发了一种优化工艺,以实现无空隙填充沟槽及其上方均匀的平面层,具有接近垂直的侧壁图案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Synergy between quantum computing and semiconductor technology New registration calibration strategies for MBMW tools by PROVE measurements OPC flow for non-conventional layouts: specific application to optical diffusers Lithographic performance of resist ma-N 1402 in an e-beam/i-line stepper intra-level mix and match approach High-precision optical constant characterization of materials in the EUV spectral range: from large research facilities to laboratory-based instruments
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1