{"title":"Calibration of Surface Damage by the Comparator Method","authors":"T. Wojtowicz","doi":"10.1364/oft.1992.tua5","DOIUrl":null,"url":null,"abstract":"The growing volume value of trade in optical and opto-electronic components, which is influenced by localised surface quality, has highlighted the need for harmonization of the different approaches for its measurement currently in use around the world.","PeriodicalId":142307,"journal":{"name":"Optical Fabrication and Testing Workshop","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Fabrication and Testing Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1992.tua5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The growing volume value of trade in optical and opto-electronic components, which is influenced by localised surface quality, has highlighted the need for harmonization of the different approaches for its measurement currently in use around the world.
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