{"title":"Considerations in selecting a design-for-testability technique","authors":"R. Hess","doi":"10.1109/REG5.1988.15921","DOIUrl":null,"url":null,"abstract":"The four major design-for-testability (DFT) techniques-ad hoc, built-in-self-test (BIST), structured, and semistructured approaches-differ widely in their ability to meet a products test needs. A few practical guidelines can aid in choosing the DFT approach that is best for your project. The techniques are reviewed, followed by a description of the selection criteria, and concluding with the various DFT techniques being compared using the criteria to do the tradeoff analysis.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"480 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REG5.1988.15921","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The four major design-for-testability (DFT) techniques-ad hoc, built-in-self-test (BIST), structured, and semistructured approaches-differ widely in their ability to meet a products test needs. A few practical guidelines can aid in choosing the DFT approach that is best for your project. The techniques are reviewed, followed by a description of the selection criteria, and concluding with the various DFT techniques being compared using the criteria to do the tradeoff analysis.<>
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
