Electromagnetic characterization of barium ferrite thick film samples in the KP band

L. Jakab, T. Berceli
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Abstract

A method for the broadband measurement of the complex permittivity of barium ferrite (BaF) thick film samples in a partially filled rectangular waveguide is presented. The material characterization is based on the measurement of the reflection and the transmission coefficients of the rectangular waveguide containing the demagnetized ferrite sample. We present the detailed numerical method for the calculation of the complex permittivity from the measured scattering matrix. First the propagation constant is deduced from the scattering parameters followed by the determination of the cutoff wavenumber for the partially filled section of the waveguide. Finally, the material parameters are calculated based on the analytical solution of the partially filled waveguide. The method is verified by 3-D electromagnetic simulation tools and by reference measurements on known samples.
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钡铁氧体厚膜样品在KP波段的电磁特性
提出了一种在部分填充矩形波导中宽带测量钡铁氧体(BaF)厚膜样品复介电常数的方法。材料表征是基于测量包含退磁铁氧体样品的矩形波导的反射系数和透射系数。本文给出了由实测散射矩阵计算复介电常数的详细数值方法。首先由散射参数推导出传播常数,然后确定波导部分填充段的截止波数。最后,根据部分填充波导的解析解计算了材料参数。该方法通过三维电磁仿真工具和已知样品的参考测量进行了验证。
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