{"title":"An improved integration-reset controlled single phase unity-power-factor boost rectifier with lower distortion","authors":"C. Qiao, K. Smedley, Z. Lai, Mehmet Nabant","doi":"10.1109/IECON.1999.822209","DOIUrl":null,"url":null,"abstract":"This paper proposes an improved integration method to realize single phase power factor correction in continuous conduction mode by adding a ripple compensation network comprised of two resistors to the basic integration control circuitry. This method effectively reduces the total harmonic distortion (THD) in the input current. The proposed method is easy to implement. Theoretical analysis is given in detail. Experimental results demonstrate the validity of the approach. This method is very suitable for IC fabrication.","PeriodicalId":378710,"journal":{"name":"IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IECON.1999.822209","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
This paper proposes an improved integration method to realize single phase power factor correction in continuous conduction mode by adding a ripple compensation network comprised of two resistors to the basic integration control circuitry. This method effectively reduces the total harmonic distortion (THD) in the input current. The proposed method is easy to implement. Theoretical analysis is given in detail. Experimental results demonstrate the validity of the approach. This method is very suitable for IC fabrication.
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