Spectrometric Methods for the Measurement of Impurities in Alpha and Beta Emitting Radionuclides

P. Dryák, L. Kokta, J. Zderadička
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Abstract

Ge(Li) spectrometers are generally used for discovering of impurities of the solutions of radionuclides. This device is not possible to be used in cases, when the admixture of the pure alpha or beta emitting radionuclide is expected. For this rare cases a method based on the spectrometry alpha resp. beta rays was developed in the UVVVR [1 – 3]. For measurement of alpha impurities Si surface barrier detector (FWHM about 20 keV for 241Am) is used, sources are prepared by an electrolytical method and spectra are processed by similar methods used in gamma spectrometry. For measurement of beta imputiries Si(Li) detector with depth 2 mm is used. Continuous spectra of beta rays are proceeded by comparing the tested spectra with reference spectra of the same radionuclide. The presence of the impurity is deduced out of the deviations both one.
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放射核素和放射核素中杂质的光谱测定方法
锗(锂)光谱仪一般用于发现放射性核素溶液中的杂质。该装置不可能用于纯α或β发射放射性核素混合物的情况。对于这种罕见的情况,一种基于光谱法的方法。在UVVVR中开发了β射线[1 - 3]。对于α杂质的测量,使用Si表面势垒检测器(FWHM约为20kev, 241Am),源是通过电解方法制备的,光谱是通过类似于伽马能谱法的方法处理的。对于β杂质的测量,使用深度为2mm的Si(Li)探测器。通过将测试光谱与同一放射性核素的参考光谱进行比较,进行射线的连续光谱。杂质的存在是由两者的偏差推断出来的。
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