{"title":"On the turn-on field of carbon nanotube cathode","authors":"S. M. Chung","doi":"10.1109/IVEC.2011.5746895","DOIUrl":null,"url":null,"abstract":"Carbon nanotube (CNT) cathode is considered a hopeful new cathode for various vacuum electronics devices, and the most important specifications are turn-on field and current density. One factor that affects turn-on field most is the Schottky barrier between CNT and the metal electrode in CNT cathode. We manage to reduce this barrier by using metal-CNT hot-bonding process and found the turn-on field improved to 1–2 V/μm. Current density is found related to microscopic shielding effect, and the heating results to shifting of emission sites, thus a lowered average current density and fluctuation in emission current.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2011.5746895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Carbon nanotube (CNT) cathode is considered a hopeful new cathode for various vacuum electronics devices, and the most important specifications are turn-on field and current density. One factor that affects turn-on field most is the Schottky barrier between CNT and the metal electrode in CNT cathode. We manage to reduce this barrier by using metal-CNT hot-bonding process and found the turn-on field improved to 1–2 V/μm. Current density is found related to microscopic shielding effect, and the heating results to shifting of emission sites, thus a lowered average current density and fluctuation in emission current.
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