Anti-reflection structures for large-aperture cryogenic lenses and vacuum window in 100-GHz band

T. Nitta, M. Nagai, Y. Murayama, R. Hikawa, Ryuji Suzuki, Y. Sekimoto, H. Takakura, T. Hasebe, K. Noda, Satoshi Saeki, H. Matsuo, N. Kuno, N. Nakai
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引用次数: 3

Abstract

We are developing a 100-GHz band 109-pixel MKID camera for the Nobeyama 45-m telescope. The camera optics contains plano-convex silicon (Si) lenses with 300- and 154-mm diameters located at the 4-K and 1-K stages, and a vacuum window of 320-mm diameter. Antireflective subwavelength structures (SWSs) for the Si lenses and the vacuum window were designed to reduce surface reflection. Cyclo olefin polymer (COP) was chosen as the base material for vacuum window as the dielectric loss is comparable with high-density polyethylene and it is easy to fabricate. Antireflective SWSs optimized for 100-GHz band were simulated using ANSYS HFSS. A one-layer rectangular pillar was designed for a Si lens of 300-mm diameter and a 320-mm diameter COP window to examine the fabrication process in large areas. For 154-mm diameter Si lens, a 1.2-mm depth tapered structure was used to obtain broadband characteristics. These designed structures were fabricated on both sides using a three-axis numerically-controlled machine. An end mill and a metal-bonded dicing blade were used for cutting the COP and Si, respectively. W-band vector network analyzer was used for S-parameter measurements of the SWS formed flat surface at an ambient temperature. Average surface reflectance of Si lenses and transmittance of the COP window in the 90–110 GHz range were found at approximately 1% and 98%, respectively.
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100 ghz波段大孔径低温透镜和真空窗的增透结构
我们正在为Nobeyama 45米望远镜开发100千兆赫波段109像素MKID相机。相机光学系统包括直径为300和154毫米的平面凸硅(Si)透镜,分别位于4-K和1-K级,以及直径为320毫米的真空窗。设计了硅透镜的抗反射亚波长结构(SWSs)和真空窗来减少表面反射。选用环烯烃聚合物(COP)作为真空窗的基材,其介电损耗与高密度聚乙烯相当,且易于制备。利用ANSYS HFSS对优化后的100 ghz波段减反射SWSs进行了仿真。设计了直径为300 mm的硅透镜和直径为320 mm的COP窗口的单层矩形柱,以考察大面积的制造工艺。对于直径为154mm的Si透镜,采用深度为1.2 mm的锥形结构获得宽带特性。这些设计的结构是用三轴数控机床在两侧制造的。用立铣刀和金属结合切割刀片分别切割COP和Si。采用w波段矢量网络分析仪对环境温度下的SWS成形平面进行s参数测量。在90-110 GHz范围内,Si透镜的平均表面反射率和COP窗口的透射率分别约为1%和98%。
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