Losses in active clamped resonant DC-link inverter systems

M. Dehmlow, K. Heumann, R. Sommer
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引用次数: 6

Abstract

A detailed investigation of losses in an active clamped resonant DC-link inverter system is presented. To measure the component stress, a one phase test circuit, in which the semiconductor devices are stressed in a way similar to that in real resonant inverter systems, is described. A detailed investigation of semiconductor losses and passive component losses depending on parameters of the resonant tank is given. For the measurements fast switching and low saturation IGBTs were used. A comparison of semiconductor losses in an active clamped resonant DC link inverter and in a hard switched PWM inverter is given.<>
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有源箝位谐振直流链路逆变器系统的损耗
详细研究了有源箝位谐振直流链路逆变器系统的损耗。为了测量元件应力,描述了一种单相测试电路,其中半导体器件以类似于实际谐振逆变器系统的方式受到应力。详细研究了谐振槽参数对半导体损耗和无源元件损耗的影响。在测量中使用了快速开关和低饱和igbt。给出了有源箝位谐振直流链路逆变器和硬开关PWM逆变器中半导体损耗的比较
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