Design of DRAM sense amplifier using 45nm technology

Ankush Kumar, A. Pandey, P. Sahu, L. Chandra, R. Dwivedi, V. Mishra
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引用次数: 4

Abstract

In very large scale integration (VLSI) circuits, power consumption plays a crucial role to design memory elements and digital systems. This work proposed the power savings in DRAM sense amplifier can be done by using FSPA-VLSA (Foot Switch PMOS Access Voltage Latch Type Sense Amplifier). Applying this technique in open bit architecture of DRAM Cell during read operation, a reduction in overall power consumption has been obtained approximately 81%. The proposed circuit also has advantages in low power VLSI/ULSI design. The circuit has been designed and implemented in Cadence virtuoso tools at 45nm Technology.
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采用45nm技术的DRAM感测放大器的设计
在超大规模集成电路(VLSI)中,功耗对存储元件和数字系统的设计起着至关重要的作用。本文提出了采用FSPA-VLSA(脚踏开关PMOS接入电压锁存型感测放大器)来降低DRAM感测放大器的功耗。将该技术应用于DRAM单元读操作时的开位结构,可使总功耗降低约81%。该电路在低功耗VLSI/ULSI设计中也具有优势。该电路已在45纳米技术的Cadence virtuoso工具中设计和实现。
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