Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics

Y. Illarionov, A. Banshchikov, T. Knobloch, D. Polyushkin, S. Wachter, V. Fedorov, S. Suturin, M. Stöger-Pollach, T. Mueller, M. Vexler, N. Sokolov, T. Grasser
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引用次数: 2

Abstract

Two-dimensional (2D) electronics can enable FETs down to a few nanometers. However, these devices require scalable insulators which should form high-quality interfaces with 2D channels and maintain low gate leakage currents for sub-1nm equivalent oxide thickness (EOT). Previously used amorphous oxides result in poor interfaces with 2D materials, while hBN has mediocre dielectric properties ( ε < 5, E g = 6eV) [1] . As a promising alternative, we suggest the use of the crystalline ionic insulator CaF 2 ( ε = 8.43, E g = 12.1eV) which forms van der Waals interfaces with 2D semiconductors [2] . At the moment, CaF 2 can be grown by molecular-beam epitaxy (MBE) down to a few nanometers thickness [3] and appears promising for chemical vapour deposition (CVD) [4] and atomic-layer deposition (ALD) [5] . Here we discuss our recent progress [3] , [6] , [7] on ultra-thin CaF 2 which presents a universal platform for 2D devices. In particular, we demonstrate nanoscale MoS 2 FETs with L =50-60nm and a record-thin ~ 2nm CaF 2 insulator (EOT~ 0.9nm) which exhibits near-ideal subthreshold swing (SS).
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结晶氟化钙:纳米级二维电子器件的创纪录薄绝缘体
二维(2D)电子学可以使场效应管缩小到几纳米。然而,这些器件需要可扩展的绝缘体,这些绝缘体应该与2D通道形成高质量的接口,并在低于1nm的等效氧化物厚度(EOT)下保持低栅极泄漏电流。先前使用的非晶氧化物导致与二维材料的界面较差,而hBN的介电性能一般(ε < 5, eg = 6eV)[1]。作为一种有希望的替代方案,我们建议使用晶体离子绝缘体caf2 (ε = 8.43, eg = 12.1eV),它与二维半导体形成范德华界面[2]。目前,caf2可以通过分子束外延(MBE)生长到几纳米厚度[3],并有望用于化学气相沉积(CVD)[4]和原子层沉积(ALD)[5]。在这里,我们讨论我们在超薄caf2上的最新进展[3],[6],[7],它为2D设备提供了一个通用平台。特别是,我们展示了L =50-60nm的纳米mos2 fet和创纪录的~ 2nm caf2绝缘体(EOT~ 0.9nm),具有接近理想的亚阈值摆动(SS)。
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