{"title":"Microprocessor-based approach to industrial devices quality control","authors":"J. Ruz, A. Bautista","doi":"10.1145/1113549.1113551","DOIUrl":null,"url":null,"abstract":"An industrial devices quality control inspection system based on a general purpose microprocessor is proposed. The system employs a microprocessor CPU, timer, ROM and peripheral interfaces in the hardware portion. Software includes an algorithm incorporating data acquisition, statistical computation and command interpreting functions, plus arithmetic and conversion subroutines. Two applications have been developed and are briefly described.","PeriodicalId":210752,"journal":{"name":"SIGSMALL/PC","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SIGSMALL/PC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1113549.1113551","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
An industrial devices quality control inspection system based on a general purpose microprocessor is proposed. The system employs a microprocessor CPU, timer, ROM and peripheral interfaces in the hardware portion. Software includes an algorithm incorporating data acquisition, statistical computation and command interpreting functions, plus arithmetic and conversion subroutines. Two applications have been developed and are briefly described.