On the Capacity of MRT/MRC Diversity Technique in Full-Duplex Relay System with Hardware Impairments over Rayleigh Fading Environments

B. Nguyen, Xuan Hung Le, X. Tran, Le The Dung
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引用次数: 2

Abstract

This paper investigates the ergodic capacity (EC) of full-duplex (FD) relay system with maximal ratio transmission (MRT) and maximal ratio combining (MRC) techniques under the effect of hardware impairments (HI). We mathematically derive the closed-form expression of EC of the HI-FD relay system under the joint impact of HI and residual self-interference (RSI) over Rayleigh fading environments. Based on the derived expression, we can quickly obtain the EC expressions of related systems such as ideal hardware (ID) FD relay systems, HI half-duplex (HD) relay system, and ID-HD relay system. The Monte-Carlo simulation validates all analytical expressions. Numerical results indicate a strong effect of both HI and RSI on the EC of the considered HI-FD relay system. Specifically, EC reaches the capacity floor in the high signal-to-noise ratio (SNR) regime. Also, the influence of HI is more substantial when the RSI is smaller and vice versa.
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瑞利衰落环境下全双工中继系统中MRT/MRC分集技术的容量研究
研究了全双工(FD)中继系统中最大比传输(MRT)和最大比组合(MRC)技术在硬件损伤(HI)影响下的遍历容量(EC)。从数学上推导了瑞利衰落环境下HI- fd继电器系统在HI和残余自干扰(RSI)共同影响下的EC的封闭表达式。根据推导出的表达式,我们可以快速得到理想硬件(ID) FD继电器系统、HI半双工(HD)继电器系统、ID-HD继电器系统等相关系统的EC表达式。蒙特卡罗模拟验证了所有解析表达式。数值结果表明,HI和RSI对所考虑的HI- fd继电器系统的EC有很强的影响。具体来说,EC在高信噪比(SNR)条件下达到容量下限。RSI越小,HI的影响越大,反之亦然。
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