{"title":"Operando Soft X-Ray Spectromicroscopic Measurement and the Use for High-Performance Devices and Circuits","authors":"H. Fukidome","doi":"10.1016/B978-0-12-814160-1.00007-1","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":317907,"journal":{"name":"Monatomic Two-Dimensional Layers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Monatomic Two-Dimensional Layers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-12-814160-1.00007-1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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