GaAs/AlGaAs structures with &dgr;-doped layer for microwave detection

A. Sužiedėlis, V. Petkun, A. Kozič, V. Kazlauskaitė, A. Cerskus, G. Steikūnas, J. Gradauskas, J. Kundrotas, S. Ašmontas, I. Papsujeva, A. Narkūnas, T. Anbinderis, V. Umansky, H. Shtrikmann
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引用次数: 1

Abstract

Planar microwave detectors on the base of modulation doped AlGaAs/GaAs structures with &dgr;-doped layer were investigated in (26÷120) GHz frequency range. Comparison of the features of the microwave diodes on the base of modulation doped structures with &dgr;- and smoothly-distributed doping impurities in the AlGaAs barrier is presented. Influence of the layers composing the modulation doped structure onto detective properties of the microwave diodes is ascertained both theoretically and experimentally. In the case of the structure with &dgr;-doping this influence was less, especially, in the case of symmetrically shaped structure with n-n+ and homogeneous asymmetrically shaped modulation doped structure.
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微波探测用掺杂&dgr层的GaAs/AlGaAs结构
在(26÷120) GHz频率范围内,研究了基于掺杂&dgr层的调制掺杂AlGaAs/GaAs结构的平面微波探测器。比较了在AlGaAs势垒中掺杂&dgr;-和均匀分布的掺杂杂质调制掺杂结构的微波二极管的特性。从理论和实验两方面确定了调制掺杂结构层对微波二极管探测性能的影响。在掺杂&dgr;的结构中,这种影响较小,特别是在n-n+的对称形结构和均匀非对称形调制掺杂结构中。
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