{"title":"Worst case reliability prediction based on a prior estimate of residual defects","authors":"P. Bishop, R. Bloomfield","doi":"10.1109/ISSRE.2002.1173274","DOIUrl":null,"url":null,"abstract":"In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the \"fractional defect\" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.","PeriodicalId":159160,"journal":{"name":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th International Symposium on Software Reliability Engineering, 2002. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.2002.1173274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
In this paper we extend an earlier worst case bound reliability theory to derive a worst case reliability function R(t), which gives the worst case probability of surviving a further time t given an estimate of residual defects in the software N and a prior test time T. The earlier theory and its extension are presented and the paper also considers the case where there is a low probability of any defect existing in the program. For the "fractional defect" case, there can be a high probability of surviving any subsequent time t. The implications of the theory are discussed and compared with alternative reliability models.