(250-600) kv re-filtering narrow-spectrum x-ray half-value layer measurement method

Abstract

In this paper, we mainly study the measurement problem of the half-value layer of the narrow-spectrum (250-600) kV X-ray re-filtering narrow-band, and use the experimental and simulation methods to obtain the half-value layer of the high-energy segment re-filtering narrow spectrum. The half-value layer is one of the important parameter characteristics describing the radiation quality. Therefore, measuring the half-value layer plays an important role in the establishment of the radiation quality. The corresponding specification is not given in the additional filter ISO with a tube voltage greater than 300 kV. The method for determining the additional filter thickness used for the tube voltage greater than 300 kV is to linearly fit the relationship between the tube voltage and the additional filter in ISO, and then calculate the thickness value of the additional filter after 300 kV according to the fitted formula. After determining the thickness value, the corresponding energy spectrum is simulated by Monte Carlo simulation. The energy spectrum simulated by Monte Carlo is compared with the theoretical energy spectrum given in ISO-4037. The results show that the average energy and simulation of N250ISO are obtained. The average energy relative deviation is 0.38%, and the N300 average energy relative deviation is 0.35%. The average energy is within 5% in accordance with ISO specifications. The half-value layer of the narrow spectrum can be re-filtered by the experimental (250-600) kV X-ray by the corresponding method given in ISO.