{"title":"Statistical characterization of Isolation Performance of Multiport Amplifiers: A critical discussion","authors":"M. Aloisio, P. Angeletti, S. D'addio","doi":"10.1109/IVEC.2011.5746886","DOIUrl":null,"url":null,"abstract":"In this paper, statistical techniques for the determination of Isolation Performance of Multiport Amplifiers are described and their critical comparison is discussed. Different approaches are considered and their results are compared from an end user perspective.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2011.5746886","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this paper, statistical techniques for the determination of Isolation Performance of Multiport Amplifiers are described and their critical comparison is discussed. Different approaches are considered and their results are compared from an end user perspective.
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