Concolic testing of SystemC designs

Bin Lin, Kai Cong, Zhenkun Yang, Z. Liao, T. Zhan, Christopher Havlicek, Fei Xie
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引用次数: 9

Abstract

SystemC is a system-level modelling language widely used in the semiconductor industry. SystemC validation is both necessary and important, since undetected bugs may propagate to final silicon products, which can be extremely expensive and dangerous. However, it is challenging to validate SystemC designs due to their heavy usage of object-oriented features, event-driven simulation semantics, and inherent concurrency. In this paper, we present CTSC, an automated, easy-to-deploy, scalable, and effective binary-level concolic testing framework for SystemC designs. We have implemented CTSC and applied it to an open source SystemC benchmark. In our extensive experiments, the CTSC-generated test cases achieved high code coverage, triggered 14 assertions, and found two severe bugs. In addition, the experiments on two designs with more than 2K lines of SystemC code show that our approach scales to designs of practical sizes.
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SystemC设计的整体测试
SystemC是一种广泛应用于半导体行业的系统级建模语言。系统验证既必要又重要,因为未检测到的错误可能会传播到最终的硅产品中,这可能是非常昂贵和危险的。然而,验证SystemC设计是具有挑战性的,因为它们大量使用面向对象的特性、事件驱动的模拟语义和固有的并发性。在本文中,我们提出了CTSC,一个自动化的、易于部署的、可扩展的、有效的用于SystemC设计的二进制级集合测试框架。我们已经实现了CTSC,并将其应用于一个开源的SystemC基准测试。在我们广泛的实验中,ctsc生成的测试用例实现了高代码覆盖率,触发了14个断言,并发现了两个严重的错误。此外,在两个超过2K行的SystemC代码设计上的实验表明,我们的方法适用于实际尺寸的设计。
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