{"title":"Immunity model study on irradiation effect of Electrostatic electromagnetic pulses","authors":"J. Liu, Z.L. Tan, L. Ni","doi":"10.1109/ICCDA.2010.5541460","DOIUrl":null,"url":null,"abstract":"the energy coupling mechanism of transmission line under external electromagnetic field was researched, and mathematical model was established. According to IEC61000-4-2 standard, Electrostatic discharge immunity test was done; electric field strength around the coupling plates was also measured. The experimental results indicated that the thresholds of electrostatic discharge which made EUT damaged were different, and the HCP mode was more harmful to EUT. Magnitude of induction voltage cased by HCP was greater than the value cased by VCP, while the strength of radiative field was almost equal in the two modes. The analysis of mathematical model is accordant with the experimental result. As a result, the model is valid and is considered a promising approach to study the immunity of electronic system against ESD EMP coupling effect.","PeriodicalId":190625,"journal":{"name":"2010 International Conference On Computer Design and Applications","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference On Computer Design and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDA.2010.5541460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
the energy coupling mechanism of transmission line under external electromagnetic field was researched, and mathematical model was established. According to IEC61000-4-2 standard, Electrostatic discharge immunity test was done; electric field strength around the coupling plates was also measured. The experimental results indicated that the thresholds of electrostatic discharge which made EUT damaged were different, and the HCP mode was more harmful to EUT. Magnitude of induction voltage cased by HCP was greater than the value cased by VCP, while the strength of radiative field was almost equal in the two modes. The analysis of mathematical model is accordant with the experimental result. As a result, the model is valid and is considered a promising approach to study the immunity of electronic system against ESD EMP coupling effect.
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