Anatoly M. Filachev, L. Saginov, A. S. Kononov, A. N. Sviridov, Vladimir L. Bakumenko
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引用次数: 0
Abstract
Parameter calculations were carried of filtering devices in one of which the phenomenon of the total internal reflection was used. It is expected that these devices may be suitable for imagery of objects in the given narrow spectral bands - spectral imaging (SI) and for obtaining the spectral maps of fast flowing past processes.
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