In-Fixture Calibration of an S-Parameter Measuring System by Means of Time Domain Reflectometry

Abstract

We present a technique which resorts to the time domain capabilities of a vector network analyzer and to the network synthesia tools, in order to perform an in-fixture calibration of the S-parameter measurement system directly to the ports of the device under test. The effects of the customer's non ideal fixtures can be removed without requiring the insertion of standard components or particular loads, which can affect the calibration efectiveness. The inaccuracies due to the precision of the actual loads and to the connection repeatability are also avoided. Some simulation reeults demonstrate the very good capability of the technique. Experimental tests were also carried out on an actual microstrip transistor fixture, showing a very satisfactoty launcher modeling and de-embedding.