{"title":"Conformance Checking and Pushdown Reactive Systems","authors":"A. Bonifácio, A. Moura","doi":"10.19153/cleiej.25.3.2","DOIUrl":null,"url":null,"abstract":"Due to their asynchronous interactions, testing reactive systems is a laborious activity present in any software development project. \nIn this setting, the finite memory formalism of Labeled Transition Systems has been used to generate test suites that can be applied to check ioco conformance of implementations to a given specification. \nIn this work we turn to a more complex scenario where a stronger formalism is considered, the Visibly Pushdown Labeled Transition System (VPTS), which allows access to a potentially infinite pushdown memory. \nWe study an extension of the ioco conformance relation to VPTS models and develop polynomial time algorithms to verify conformance for VPTS models in a white-box testing scenario.","PeriodicalId":418941,"journal":{"name":"CLEI Electron. J.","volume":"149 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"CLEI Electron. J.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.19153/cleiej.25.3.2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Due to their asynchronous interactions, testing reactive systems is a laborious activity present in any software development project.
In this setting, the finite memory formalism of Labeled Transition Systems has been used to generate test suites that can be applied to check ioco conformance of implementations to a given specification.
In this work we turn to a more complex scenario where a stronger formalism is considered, the Visibly Pushdown Labeled Transition System (VPTS), which allows access to a potentially infinite pushdown memory.
We study an extension of the ioco conformance relation to VPTS models and develop polynomial time algorithms to verify conformance for VPTS models in a white-box testing scenario.