Contactless Vector Network Analysis of Embedded Two-Port Test Objects

Abstract

In the course of the increasing electrification of aviation, it is becoming more and more important to investigate the high-frequency properties of components directly at the location of installation. One variant is the contactless vector network analysis with impedance probes. This is a special type of current probe that can be used very well for contactless network analysis due to the corresponding calibration procedure. Existing measurement methods with these sensors require the test object to be disconnected from its external circuitry. In this paper an approach is presented with which test objects that remain in their external wiring can also be analysed using the contactless vector network analysis and impedance probes as contactless couplers.