V. Voronin, N. Gapon, E. Semenishchev, A. Zelensky
{"title":"Deep learning-based depth map defect removal in manufacturing","authors":"V. Voronin, N. Gapon, E. Semenishchev, A. Zelensky","doi":"10.1117/12.2678115","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":304059,"journal":{"name":"Automated Visual Inspection and Machine Vision V","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Automated Visual Inspection and Machine Vision V","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2678115","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}