A novel low-profile low-parasitic RF package using high-density build-up technology

Chien-Cheng Wei, M. Lin, Chin-Ta Fan, Ta-Hsiang Chiang, Ming-Kuen Chiu, S. Ru, Nan Ni, A. Cardona
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Abstract

This paper presents a low-profile low-parasitic RF package by using the high-density build-up (HD-BU) technology. This package achieves much thinner, fine pitch, and exposed design pattern feature for outstanding electrical and thermal performance. The packaging fabrication is simple and only needs several processes. This HD-BU package provides lower parasitic than other lead-frame types due to the use of very thin bonding pads. Additionally, a capacitor chip is assembled using the proposed technology for packaging demonstration and electrical performance evaluation. Based on the experimental results, the measured capacitances at 1-GHz are quite similar before and after packaging. It indicates that the HD-BU package has low parasitic capacitance even at high-frequency operation, and does not affect the electrical performance for the packaged chip. Therefore, these packages are good candidates for applications requiring low profile, low parasitic and low cost.
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采用高密度堆积技术的新型低轮廓低寄生射频封装
本文提出了一种采用高密度堆积(HD-BU)技术的低外形低寄生射频封装。该封装实现了更薄、更细间距和暴露的设计模式特征,具有出色的电气和热性能。包装制作简单,只需几个工序。这种HD-BU封装提供较低的寄生比其他引线框架类型,由于使用非常薄的粘合垫。此外,利用所提出的技术组装电容器芯片,用于封装演示和电气性能评估。实验结果表明,封装前后测得的1ghz电容非常相似。说明HD-BU封装在高频工作时具有较低的寄生电容,且不影响封装芯片的电气性能。因此,这些封装是要求低姿态、低寄生和低成本的应用程序的良好候选者。
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