Analyzing the Effect of Thermal Stress on Dielectric Parameters of PVC Insulated Low Voltage Cable Sample

Abstract

Cables are undoubtedly major and vital equipment in low voltage (LV) distribution networks. The majority of low voltage cable networks were constructed, as is well known, many years ago. By that time, the cables have been subjected to various stresses. The cable insulation is harmed because of these stresses, which cause failures. Therefore, the condition monitoring (CM) of these existing cable networks gained importance in past years. This study’s samples of O,6/1kV SZRMtKVM-J 4×6 mm PVC insulated cables underwent 4 cycles of thermal stress at 110°C. Each round lasts for six hours. The effects of thermal stress on cable insulation were investigated in time and frequency domain. The extended voltage response (EVR) method is used for time-domain spectroscopy, while Wayne Kerr impedance analyzer is used for frequency domain spectroscopy. This paper presents the initial findings from the current laboratory experiment.