{"title":"Cybersecurity Testing Technology in Smart Substations","authors":"Yi Yang, Hai-Qing Xu, K. Mclaughlin, S. Sezer, Haitao Jiang, Wei Huang","doi":"10.1016/b978-0-12-815158-7.00007-x","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":163244,"journal":{"name":"IEC 61850-Based Smart Substations","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEC 61850-Based Smart Substations","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/b978-0-12-815158-7.00007-x","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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