{"title":"Fourier analysis of strain measurement using highly birefringent two-mode optical fibers","authors":"T. Wolinski, M. Muszkowski","doi":"10.1109/IMTC.1994.351797","DOIUrl":null,"url":null,"abstract":"A new approach to strain measurement based on Fourier analysis of strain-induced polarization and intermodal coupling in HB two-mode elliptical-core fibers is presented. We have applied the Fourier method to analyze different types of polarization and intermodal couplings occurring in a highly birefringent elliptical-core fiber (UMCS, Lublin). The results obtained indicate that Fourier spectra of sin-like strain-dependent characteristics can create a very important tool in projecting practical devices which will measure longitudinal strain in specific applications.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1994.351797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A new approach to strain measurement based on Fourier analysis of strain-induced polarization and intermodal coupling in HB two-mode elliptical-core fibers is presented. We have applied the Fourier method to analyze different types of polarization and intermodal couplings occurring in a highly birefringent elliptical-core fiber (UMCS, Lublin). The results obtained indicate that Fourier spectra of sin-like strain-dependent characteristics can create a very important tool in projecting practical devices which will measure longitudinal strain in specific applications.<>