Optimal switching architecture for Automated Test Equipment

Abstract

One of the most common architectural decisions facing the designer of Automated Test Equipment (ATE) is the switching, or multiplexing, of limited ATE stimulus and measurement resources between multiple test points at the Unit Under Test (UUT). In the abstract these switches and the associated cabling, interface chassis, etc. form a mapping layer between the tester resources and the UUT test points. When deciding on a switching architecture the ATE designer must consider multiple performance criteria including: cost, size, signal quality, reliability and serviceability. This paper looks at the various switching architecture options available to the ATE designer and provides guidance for choosing the best architecture for the application.