Youngkwan Jo, Yongjin Ji, Minkyu Kim, S. Lischke, C. Mai, L. Zimmermann, W. Choi
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引用次数: 0
Abstract
Monte-Carlo characterization based on the Si ring modulator equivalent circuit is performed for the modulation frequency responses based on experimentally determined key behavior model parameter distributions. Such Montel-Carlo characterization allows prediction of the statistical distribution of the performance metrics for Si photonic integrated circuit design.
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