Bichen Chen, M. Tsiklauri, Chunyu Wu, Shuai Jin, J. Fan, X. Ye, Bill Samaras
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引用次数: 28
Abstract
De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.
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