S. Shukuri, S. Shimizu, N. Ajika, T. Ogura, M. Mihara, Y. Kawajiri, K. Kobayashi, M. Nakashima
{"title":"A 10k-Cycling Reliable 90nm Logic NVM \"eCFlash\" (Embedded CMOS Flash) Technology","authors":"S. Shukuri, S. Shimizu, N. Ajika, T. Ogura, M. Mihara, Y. Kawajiri, K. Kobayashi, M. Nakashima","doi":"10.1109/IMW.2011.5873184","DOIUrl":null,"url":null,"abstract":"NA","PeriodicalId":261995,"journal":{"name":"2011 3rd IEEE International Memory Workshop (IMW)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 3rd IEEE International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2011.5873184","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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