IGBT fault diagnosis using adaptive thresholds during the turn-on transient

Abstract

This paper presents the design of an electronic fault detection circuit in the insulated gate bipolar transistor (IGBT) based on the exclusive measurement of the gate signal during the turn-on transient. In order to increase the effectiveness of the detection and to tolerate the variations of input to system, adaptable thresholds have been added to the circuit. There are three important aspects in this research, specifically: 1 - Early detection, since the evaluation is realized during the turn-on transient; 2 - Reducing false alarms, because the variations of input to the system are considered; 3 - A realistic design, since the components used are commercially available, and the IGBT model used is the standard for PSpice software which has already been widely validated in the literature.