Time-domain measurements of transient field coupling through slots

Koh Wee Jin, Tan Joo Huat, T. Roland, K.C.H. Ernest
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引用次数: 2

Abstract

Recent advancements in the field of communications technology include the use of high speed data transmissions with extremely wide frequency bandwidth. This technology is widely employed in ultra-wideband (UWB) communication systems which can produce significant EM emissions at microwave frequencies. A key element in assessing the vulnerability of equipment to UWB signals involves an understanding on the phenomenon of transient electromagnetic energy coupling into cavity-like objects. When the wavelength of microwave sources is comparable to the size of the ports of entry (slots, apertures, seams, cracks, protruding connectors, etc.), the latter is no longer below the cut-off frequency, allowing significant amount of microwave energy to penetrate into internal susceptible electronics. In fact, these coupling paths can be highly resonating at certain microwave frequencies making EM shielding a challenging task. This paper examines the coupling effects of transient UWB signals into a rectangular shielded enclosure with two different slot sizes, through physical measurements using a time-domain technique
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通过槽的瞬态场耦合的时域测量
通信技术领域的最新进展包括使用极宽频率带宽的高速数据传输。该技术广泛应用于超宽带(UWB)通信系统中,该系统在微波频率下会产生显著的电磁辐射。在评估设备对超宽带信号的脆弱性时,一个关键因素是对瞬态电磁能量耦合到腔状物体的现象的理解。当微波源的波长与入口端口(槽、孔径、接缝、裂缝、突出的连接器等)的尺寸相当时,后者不再低于截止频率,从而允许大量微波能量穿透内部易感电子设备。事实上,这些耦合路径在某些微波频率下可能会产生高度谐振,这使得电磁屏蔽成为一项具有挑战性的任务。本文通过使用时域技术的物理测量,研究了瞬态超宽带信号进入具有两种不同插槽尺寸的矩形屏蔽外壳的耦合效应
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