Hideharu Kojima, Y. Kakuda, Juichi Takahashi, T. Ohta
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引用次数: 8
Abstract
Recently, the embedded software, which is implemented in high definition TVs, recorders and cellar phones and so on, are complicated. There are several reasons. One of the reasons is that embedded software will be implemented with libraries for concurrent processing such as pthread in C language. Developers have to be aware that concurrent programming by using multithread, multi-process and so on. However, concurrent programming is harder than sequential programming. It is possible to cause defects such as race conditions, dead lock and so on. In this paper, we employ ACP (all concurrent paths) and CMFG (concurrent module flow graph) to execute white box testing for the source code of the concurrent software. The number of test cases of ACP becomes huge when the number of blocks increases. In this paper, we propose to suppress the number of test cases of ACP and measure the coverage of ACP by a tool.
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