A first-order mechanistic model for architectural vulnerability factor

Arun A. Nair, Stijn Eyerman, L. Eeckhout, L. John
{"title":"A first-order mechanistic model for architectural vulnerability factor","authors":"Arun A. Nair, Stijn Eyerman, L. Eeckhout, L. John","doi":"10.1145/2366231.2337191","DOIUrl":null,"url":null,"abstract":"Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probability that a radiation-induced fault in a hardware structure will manifest as an error at the program output. AVF estimation requires detailed microarchitectural simulations which are time-consuming and typically present aggregate metrics. Moreover, it requires a large number of simulations to derive insight into the impact of microarchitectural events on AVF. In this work we present a first-order mechanistic analytical model for computing AVF by estimating the occupancy of correct-path state in important microarchitecture structures through inexpensive profiling. We show that the model estimates the AVF for the reorder buffer, issue queue, load and store queue, and functional units in a 4-wide issue machine with a mean absolute error of less than 0.07. The model is constructed from the first principles of out-of-order processor execution in order to provide novel insight into the interaction of the workload with the microarchitecture to determine AVF. We demonstrate that the model can be used to perform design space explorations to understand trade-offs between soft error rate and performance, to study the impact of scaling of microarchitectural structures on AVF and performance, and to characterize workloads for AVF.","PeriodicalId":193578,"journal":{"name":"2012 39th Annual International Symposium on Computer Architecture (ISCA)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 39th Annual International Symposium on Computer Architecture (ISCA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2366231.2337191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 37

Abstract

Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probability that a radiation-induced fault in a hardware structure will manifest as an error at the program output. AVF estimation requires detailed microarchitectural simulations which are time-consuming and typically present aggregate metrics. Moreover, it requires a large number of simulations to derive insight into the impact of microarchitectural events on AVF. In this work we present a first-order mechanistic analytical model for computing AVF by estimating the occupancy of correct-path state in important microarchitecture structures through inexpensive profiling. We show that the model estimates the AVF for the reorder buffer, issue queue, load and store queue, and functional units in a 4-wide issue machine with a mean absolute error of less than 0.07. The model is constructed from the first principles of out-of-order processor execution in order to provide novel insight into the interaction of the workload with the microarchitecture to determine AVF. We demonstrate that the model can be used to perform design space explorations to understand trade-offs between soft error rate and performance, to study the impact of scaling of microarchitectural structures on AVF and performance, and to characterize workloads for AVF.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
建筑脆弱性因子的一阶机制模型
软误差可靠性已成为现代微处理器的一级设计准则。架构脆弱性因子(AVF)建模通常用于捕获硬件结构中辐射引起的故障在程序输出中表现为错误的概率。AVF估计需要详细的微架构模拟,这是耗时的,并且通常呈现聚合度量。此外,它需要大量的模拟来深入了解微架构事件对AVF的影响。在这项工作中,我们提出了一个计算AVF的一阶机制分析模型,该模型通过廉价的剖面来估计重要微结构中正确路径状态的占用。我们表明,该模型估计了4宽问题机中重新排序缓冲区、问题队列、加载和存储队列以及功能单元的AVF,平均绝对误差小于0.07。该模型是根据乱序处理器执行的第一原则构建的,以便对工作负载与微体系结构的交互提供新的见解,以确定AVF。我们证明,该模型可用于执行设计空间探索,以了解软错误率和性能之间的权衡,研究微架构结构的缩放对AVF和性能的影响,并表征AVF的工作负载。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Can traditional programming bridge the Ninja performance gap for parallel computing applications? Towards energy-proportional datacenter memory with mobile DRAM A micro-architectural analysis of switched photonic multi-chip interconnects Staged memory scheduling: Achieving high performance and scalability in heterogeneous systems Enhancing effective throughput for transmission line-based bus
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1