Po-Chen Chen, V. Malbasa, T. Dokic, M. Kezunovic, Yimai Dong
{"title":"Sensitivity of voltage sag based fault location in distribution network to sub-cycle faults","authors":"Po-Chen Chen, V. Malbasa, T. Dokic, M. Kezunovic, Yimai Dong","doi":"10.1109/NAPS.2014.6965361","DOIUrl":null,"url":null,"abstract":"Single-phase-to-ground sub-cycle faults in the distribution network can be located using voltage sag fault location. This paper illustrates how a sensitivity study of measurement imperfections can be used to quantify the impact of sub-cycle faults on voltage sag based fault location. Our results suggest that there is a complex relationship between factors influencing error in fault location because the design of the study covered a wide range of conditions. The more complicated, higher order interactions have a stronger influence on error than any particular input factor alone.","PeriodicalId":421766,"journal":{"name":"2014 North American Power Symposium (NAPS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 North American Power Symposium (NAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAPS.2014.6965361","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Single-phase-to-ground sub-cycle faults in the distribution network can be located using voltage sag fault location. This paper illustrates how a sensitivity study of measurement imperfections can be used to quantify the impact of sub-cycle faults on voltage sag based fault location. Our results suggest that there is a complex relationship between factors influencing error in fault location because the design of the study covered a wide range of conditions. The more complicated, higher order interactions have a stronger influence on error than any particular input factor alone.