Frequency response measurement of Mach-Zehnder modulators utilizing double carrier based on low frequency detection

Zhiyao Zhang, Yaowen Zhang, Lingjie Zhang, Ying-Xuan Xu, Yutong He, Shang-jian Zhang, Yujia Zhang, Yong Liu
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Abstract

A frequency-shifted dual-carrier method is proposed for microwave characterization of Mach-Zehnder modulators based on low frequency detection. The proposed method utilizes the heterodyne products between the beats of two modulated sidebands, and achieves calibration-free microwave measurement of Mach-Zehnder modulators with the help of electrical spectrum analysis. Our method features low-frequency detection with only one microwave source and avoids the responsivity correction introduced by the photodetector. In the experiment, the frequency response of a Mach-Zehnder electro-optic intensity modulator is measured by using the proposed method, where the measurement results fit in with those obtained by using the conventional optical spectrum analysis method.
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基于低频检测的双载波马赫-曾德尔调制器频率响应测量
提出了一种基于低频检测的马赫-曾德尔调制器微波特性的移频双载波方法。该方法利用两个调制边带拍差之间的外差积,借助电谱分析实现了马赫-曾德尔调制器的免校准微波测量。该方法的特点是仅使用一个微波源进行低频检测,避免了光电探测器引入的响应性校正。在实验中,用该方法测量了马赫-曾德尔电光强度调制器的频率响应,测量结果与传统光谱分析方法的测量结果吻合。
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