All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter

Jaehyun Jeong, T. Iizuka, T. Nakura, M. Ikeda, K. Asada
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引用次数: 3

Abstract

This paper presents an all-digital PMOS and NMOS process variability monitor which utilizes a simple buffer ring with a pulse counter. The proposed circuit monitors the process variability according to a count number of a single pulse which propagates on the buffer ring and a fixed logic level after the pulse vanishes. The proposed circuit has been fabricated in 65nm CMOS process and the measurement results demonstrate that we can monitor the PMOS and NMOS variabilities independently using the proposed monitoring circuit.
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全数字PMOS和NMOS过程可变性监视器利用缓冲环与脉冲计数器
本文提出了一种全数字PMOS和NMOS过程变异性监视器,它利用一个简单的带脉冲计数器的缓冲环。所提出的电路根据在缓冲环上传播的单个脉冲的计数数和脉冲消失后的固定逻辑电平来监视过程可变性。该电路已在65nm CMOS工艺下制作完成,测量结果表明,利用该电路可以独立监测PMOS和NMOS的变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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