Robust optimization of serial link system for signal integrity and power integrity

J. N. Tripathi, R. Nagpal, Rakesh Malik
{"title":"Robust optimization of serial link system for signal integrity and power integrity","authors":"J. N. Tripathi, R. Nagpal, Rakesh Malik","doi":"10.1109/NESEA.2010.5678052","DOIUrl":null,"url":null,"abstract":"Signal Integrity (SI) and Power Integrity (PI) are the most critical issues for higher operational speeds in semiconductor industry. This work identifies and optimizes the parameters of board, package and termination environment, influencing the signal integrity and power integrity of serial link. System level model has been created for USB HSLINK taking into account the external parameters like board, package, measurement environment which influence the performance of the channel. Parameters variations appearing from manufactura-bility constraints, material property constraints, design tolerance etc affecting the serial link performance has been optimized using Taguchi method based on statistical co-analysis. Using the Taguchi statistical techniques, sensitivity analysis on parameter variations affecting HSLINK performance is analyzed and optimized for desired performance.","PeriodicalId":348247,"journal":{"name":"2010 IEEE International Conference on Networked Embedded Systems for Enterprise Applications","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Networked Embedded Systems for Enterprise Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NESEA.2010.5678052","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Signal Integrity (SI) and Power Integrity (PI) are the most critical issues for higher operational speeds in semiconductor industry. This work identifies and optimizes the parameters of board, package and termination environment, influencing the signal integrity and power integrity of serial link. System level model has been created for USB HSLINK taking into account the external parameters like board, package, measurement environment which influence the performance of the channel. Parameters variations appearing from manufactura-bility constraints, material property constraints, design tolerance etc affecting the serial link performance has been optimized using Taguchi method based on statistical co-analysis. Using the Taguchi statistical techniques, sensitivity analysis on parameter variations affecting HSLINK performance is analyzed and optimized for desired performance.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于信号完整性和功率完整性的串行链路系统鲁棒优化
信号完整性(SI)和功率完整性(PI)是半导体行业提高运算速度的最关键问题。本文对影响串行链路信号完整性和功率完整性的电路板、封装和终端环境参数进行了识别和优化。考虑到电路板、封装、测量环境等外部参数对通道性能的影响,建立了USB HSLINK的系统级模型。采用基于统计共分析的田口法对影响串联连杆性能的可制造性约束、材料性能约束、设计公差等参数变化进行了优化。利用田口统计技术,对影响HSLINK性能的参数变化进行了敏感性分析,并对其性能进行了优化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Data traffic based route selection for real-time data delivery in wireless sensor networks Composition challenges and approaches for cyber physical systems Low power, small die-size PLL using semi-digital storage instead of big loop filter capacitance Preserving Privacy and Assuring Integrity in data aggregation for Wireless Sensor Networks Middleware for resource sharing in multi-purpose Wireless Sensor Networks
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1