Software reliability modeling with the generalized logistic test coverage function

Abstract

Test coverage is a effective approach of testing effectiveness and adequacy, which has positive impact on software reliability and defect coverage. The test coverage function describes the change of test coverage during the test procedure, and it is an important factor of software reliability models with test coverage. In this paper, the change of test coverage is represented by the generalized logistic function. On the basic of this generalized test coverage function, a new software reliability growth model and a new fault defection model are proposed. The models can be used for quantitative evaluation and predict the software reliability. We test the goodness of fit of the proposed models by using several sets of software testing data and the result is better.